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esp32/test: add tests for reset reasons

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This commit is contained in:
Ivan Grokhotkov
2018-07-29 14:17:09 +03:00
parent 0aa384d40c
commit 3ef650cd46
7 changed files with 239 additions and 177 deletions
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27
components/esp32/test/test_attr.c Normal file
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#include "unity.h"
#include "esp_attr.h"
#include "esp_log.h"
static __NOINIT_ATTR uint32_t s_noinit;
static RTC_NOINIT_ATTR uint32_t s_rtc_noinit;
static RTC_DATA_ATTR uint32_t s_rtc_data;
extern int _rtc_noinit_start;
extern int _rtc_noinit_end;
extern int _rtc_data_start;
extern int _rtc_data_end;
extern int _noinit_start;
extern int _noinit_end;
static bool data_in_segment(void *ptr, int *seg_start, int *seg_end)
{
return ((intptr_t)ptr < (intptr_t)seg_end) && \
((intptr_t)ptr >= (intptr_t)seg_start);
}
TEST_CASE("Attributes place variables into correct sections", "[ld]")
{
TEST_ASSERT(data_in_segment(&s_noinit, &_noinit_start, &_noinit_end));
TEST_ASSERT(data_in_segment(&s_rtc_noinit, &_rtc_noinit_start, &_rtc_noinit_end));
TEST_ASSERT(data_in_segment(&s_rtc_data, &_rtc_data_start, &_rtc_data_end));
}