fix(spi_flash): Fix issue that flash encryption failed while rom_impl config is enabled

The issue is `esp_flash_write_encryped` function in ROM on ESP32C3, ESP32S3
calls legacy implementation, which uses old configuration. And this causes
write fails.
The solution in this commit is to compile and link this function(and related)
in IRAM instead of the ROM one.
The IRAM cost increases around 1.2KB after the fix

examples/security/flash_encryption/pytest_flash_encryption.py

@@ -1,8 +1,5 @@
-# SPDX-FileCopyrightText: 2018-2022 Espressif Systems (Shanghai) CO LTD
+# SPDX-FileCopyrightText: 2018-2024 Espressif Systems (Shanghai) CO LTD
 # SPDX-License-Identifier: Apache-2.0
-
-from __future__ import print_function
-
 import binascii
 from collections import namedtuple
 from io import BytesIO
@@ -19,10 +16,7 @@ from pytest_embedded import Dut
 #   espefuse.py --do-not-confirm -p $ESPPORT burn_efuse FLASH_CRYPT_CONFIG 0xf
 #   espefuse.py --do-not-confirm -p $ESPPORT burn_efuse FLASH_CRYPT_CNT 0x1
 #   espefuse.py --do-not-confirm -p $ESPPORT burn_key flash_encryption key.bin
-@pytest.mark.esp32
-@pytest.mark.esp32c3
-@pytest.mark.flash_encryption
-def test_examples_security_flash_encryption(dut: Dut) -> None:
+def _test_flash_encryption(dut: Dut) -> None:
     # Erase the nvs_key partition
     dut.serial.erase_partition('nvs_key')
     # calculate the expected ciphertext
@@ -66,3 +60,23 @@ def test_examples_security_flash_encryption(dut: Dut) -> None:
     ]
     for line in lines:
         dut.expect(line, timeout=20)
+
+
+@pytest.mark.esp32
+@pytest.mark.esp32c3
+@pytest.mark.flash_encryption
+def test_examples_security_flash_encryption(dut: Dut) -> None:
+    _test_flash_encryption(dut)
+
+
+@pytest.mark.esp32c3
+@pytest.mark.flash_encryption
+@pytest.mark.parametrize(
+    'config',
+    [
+        'rom_impl',
+    ],
+    indirect=True,
+)
+def test_examples_security_flash_encryption_rom_impl(dut: Dut) -> None:
+    _test_flash_encryption(dut)