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ci: partially enable ut tests for esp32c2
Disabled test cases are tracked in: IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131 - test_fatfs: IDF-5136 - test_pm: IDF-5053 - test_cache_mmu: IDF-5138 - test_partitions: IDF-5137 - test_vfs: IDF-5139 - test_freertos: IDF-5140 - test_wpa_supplicant: IDF-5046 - test_mbedtls: IDF-5141 - test_pthread: IDF-5142 - test_protocomm: IDF-5143 - test_lightsleep: IDF-5053 - test_taskwdt: IDF-5055 - test_tcp_transport: IDF-5144 - test_app_update: IDF-5145 - test_timer: IDF-5052 - test_spi: IDF-5146 - test_rtc_clk: IDF-5060 - test_heap: IDF-5167 ci: fixed issues for tests of libgcc, ets_timer, newlib test_pm: support on C2
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committed by
morris
parent
f7be540222
commit
6a8aed12ee
@@ -18,6 +18,8 @@
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#include "esp32c3/rom/ets_sys.h"
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#elif CONFIG_IDF_TARGET_ESP32H2
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#include "esp32h2/rom/ets_sys.h"
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#elif CONFIG_IDF_TARGET_ESP32C2
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#include "esp32c2/rom/ets_sys.h"
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#endif
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static void test_correct_delay_timer_func(void* arg)
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