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ci: partially enable ut tests for esp32c2

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Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2
This commit is contained in:
Michael (XIAO Xufeng)
2022-05-20 18:16:47 +08:00
committed by morris
parent f7be540222
commit 6a8aed12ee
73 changed files with 490 additions and 140 deletions
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3
components/heap/test/test_diram.c
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@@ -10,6 +10,8 @@
#define ALLOC_SZ 1024
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
//IDF-5167
static void *malloc_block_diram(uint32_t caps)
{
void *attempts[256] = { 0 }; // Allocate up to 256 ALLOC_SZ blocks to exhaust all non-D/IRAM memory temporarily
@@ -72,3 +74,4 @@ TEST_CASE("Allocate D/IRAM as IRAM", "[heap]")
free(iram);
}
#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)