ci: partially enable ut tests for esp32c2

Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2

components/mbedtls/test/test_ecp.c

@@ -31,6 +31,8 @@ which are undefined if the following flag is not defined */
    error hex value (mbedTLS uses -N for error codes) */
 #define TEST_ASSERT_MBEDTLS_OK(X) TEST_ASSERT_EQUAL_HEX32(0, -(X))
 
+#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
+//IDF-5141
 TEST_CASE("mbedtls ECDH Generate Key", "[mbedtls]")
 {
     mbedtls_ecdh_context ctx;
@@ -84,6 +86,7 @@ TEST_CASE("mbedtls ECP mul w/ koblitz", "[mbedtls]")
     mbedtls_ctr_drbg_free(&ctxRandom);
     mbedtls_entropy_free(&ctxEntropy);
 }
+#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
 
 #if CONFIG_MBEDTLS_HARDWARE_ECC
 /*
@@ -154,6 +157,8 @@ const uint8_t ecc_p256_mul_res_y[] = {
     0xC7, 0xD4, 0x0C, 0x90, 0xA1, 0xC9, 0xD3, 0x3A
 };
 
+#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
+//IDF-5141
 static int rng_wrapper(void *ctx, unsigned char *buf, size_t len)
 {
     esp_fill_random(buf, len);
@@ -253,4 +258,5 @@ TEST_CASE("mbedtls ECP point verify with SECP256R1", "[mbedtls]")
 {
     test_ecp_verify(MBEDTLS_ECP_DP_SECP256R1, ecc_p256_mul_res_x, ecc_p256_mul_res_y);
 }
+#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
 #endif /* CONFIG_MBEDTLS_HARDWARE_ECC */