ci: partially enable ut tests for esp32c2

Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2

components/mbedtls/test/test_mbedtls_mpi.c

@@ -15,9 +15,12 @@
 #include "freertos/semphr.h"
 #include "unity.h"
 #include "sdkconfig.h"
+#include "test_utils.h"
 
 #define MBEDTLS_OK 0
 
+#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
+//IDF-5141
 /* Debugging function to print an MPI number to stdout. Happens to
    print output that can be copy-pasted directly into a Python shell.
 */
@@ -274,3 +277,4 @@ TEST_CASE("test MPI modexp", "[bignum]")
 
     TEST_ASSERT_FALSE_MESSAGE(test_error, "mbedtls_mpi_exp_mod incorrect for some tests\n");
 }
+#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)