ci: partially enable ut tests for esp32c2

Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2

components/vfs/test/test_vfs_append.c

@@ -13,6 +13,7 @@
 #include "esp_vfs_fat.h"
 #include "esp_spiffs.h"
 #include "wear_levelling.h"
+#include "test_utils.h"
 
 #define TEST_PARTITION_LABEL "flash_test"
 
@@ -77,6 +78,8 @@ static void test_append(const char *path)
     TEST_ASSERT_NOT_EQUAL(-1, unlink(path));
 }
 
+#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
+//IDF-5139
 TEST_CASE("open() with O_APPEND on FATFS works well", "[vfs][FATFS]")
 {
     wl_handle_t test_wl_handle;
@@ -91,6 +94,7 @@ TEST_CASE("open() with O_APPEND on FATFS works well", "[vfs][FATFS]")
 
     TEST_ESP_OK(esp_vfs_fat_spiflash_unmount_rw_wl("/spiflash", test_wl_handle));
 }
+#endif //!TEMPORARY_DISABLED_FOR_TARGETS(ESP32C2)
 
 TEST_CASE("open() with O_APPEND on SPIFFS works well", "[vfs][spiffs]")
 {