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ci: disable unavailable tests for esp32s2beta

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This commit is contained in:
Michael (XIAO Xufeng)
2019-08-27 17:36:53 +08:00
committed by Angus Gratton
parent e44df658d5
commit 76a3a5fb48
30 changed files with 707 additions and 748 deletions
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13
components/unity/include/unity_test_runner.h
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@@ -130,6 +130,8 @@ void unity_testcase_register(test_desc_t* desc);
unity_testcase_register( & UNITY_TEST_UID(test_desc_) ); \
}
/*
* First argument is a free-form description,
* second argument is (by convention) a list of identifiers, each one in square brackets.
@@ -172,3 +174,14 @@ void unity_run_all_tests(void);
void unity_run_menu(void);
#include "sdkconfig.h"
#if CONFIG_IDF_TARGET_ESP32
#define TEST_CASE_ESP32(...) TEST_CASE(__VA_ARGS__)
#define TEST_CASE_MULTIPLE_STAGES_ESP32(...) TEST_CASE_MULTIPLE_STAGES(__VA_ARGS__)
#define TEST_CASE_MULTIPLE_DEVICES_ESP32(...) TEST_CASE_MULTIPLE_DEVICES(__VA_ARGS__)
#else
#define TEST_CASE_ESP32(...) __attribute__((unused)) static void UNITY_TEST_UID(test_func_) (void)
#define TEST_CASE_MULTIPLE_STAGES_ESP32(_, __, ...) __attribute__((unused)) static test_func UNITY_TEST_UID(test_functions)[] = {__VA_ARGS__};
#define TEST_CASE_MULTIPLE_DEVICES_ESP32(_, __, ...) __attribute__((unused)) static test_func UNITY_TEST_UID(test_functions)[] = {__VA_ARGS__};
#endif