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esp_flash: fix the regression of non-quad mode by default chip driver

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This commit is contained in:
Armando
2020-06-01 15:27:18 +08:00
parent 28b4419c4e
commit aa5b4fb372
4 changed files with 40 additions and 19 deletions
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29
components/spi_flash/test/test_esp_flash.c
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@@ -49,6 +49,9 @@ typedef void (*flash_test_func_t)(esp_flash_t* chip);
#define FLASH_TEST_CASE(STR, FUNC_TO_RUN) \
TEST_CASE(STR, "[esp_flash]") {flash_test_func(FUNC_TO_RUN, 1 /* first index reserved for main flash */ );}
#define FLASH_TEST_CASE_IGNORE(STR, FUNC_TO_RUN) \
TEST_CASE(STR, "[esp_flash][ignore]") {flash_test_func(FUNC_TO_RUN, 1 /* first index reserved for main flash */ );}
/* Use FLASH_TEST_CASE_3 for tests which also run on external flash, which sits in the place of PSRAM
(these tests are incompatible with PSRAM)
@@ -56,9 +59,13 @@ typedef void (*flash_test_func_t)(esp_flash_t* chip);
*/
#if defined(CONFIG_SPIRAM_SUPPORT)
#define FLASH_TEST_CASE_3(STR, FUNCT_TO_RUN)
#define FLASH_TEST_CASE_3_IGNORE(STR, FUNCT_TO_RUN)
#else
#define FLASH_TEST_CASE_3(STR, FUNC_TO_RUN) \
TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
#define FLASH_TEST_CASE_3_IGNORE(STR, FUNC_TO_RUN) \
TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH][ignore]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
#endif
//currently all the configs are the same with esp_flash_spi_device_config_t, no more information required
@@ -408,7 +415,7 @@ esp_err_t esp_flash_set_io_mode(esp_flash_t* chip, bool qe);
esp_err_t esp_flash_get_io_mode(esp_flash_t* chip, bool* qe);
esp_err_t esp_flash_read_chip_id(esp_flash_t* chip, uint32_t* flash_id);
static bool check_winbond_chip(esp_flash_t* chip)
static bool is_winbond_chip(esp_flash_t* chip)
{
uint32_t flash_id;
esp_err_t ret = esp_flash_read_chip_id(chip, &flash_id);
@@ -430,14 +437,15 @@ static void test_toggle_qe(esp_flash_t* chip)
esp_err_t ret = esp_flash_get_io_mode(chip, &qe);
TEST_ESP_OK(ret);
bool is_winbond_chip = check_winbond_chip(chip);
bool allow_failure = is_winbond_chip(chip);
for (int i = 0; i < 4; i ++) {
ESP_LOGI(TAG, "write qe: %d->%d", qe, !qe);
qe = !qe;
chip->read_mode = qe? SPI_FLASH_QOUT: SPI_FLASH_SLOWRD;
ret = esp_flash_set_io_mode(chip, qe);
if (is_winbond_chip && !qe && ret == ESP_ERR_FLASH_NO_RESPONSE) {
if (allow_failure && !qe && ret == ESP_ERR_FLASH_NO_RESPONSE) {
//allows clear qe failure for Winbond chips
ret = ESP_OK;
}
@@ -447,8 +455,12 @@ static void test_toggle_qe(esp_flash_t* chip)
ret = esp_flash_get_io_mode(chip, &qe_read);
TEST_ESP_OK(ret);
ESP_LOGD(TAG, "qe read: %d", qe_read);
if (qe != qe_read && !qe && is_winbond_chip) {
ESP_LOGE(TAG, "cannot clear QE bit, this may be normal for Winbond chips.");
if (!qe && qe_read) {
if (allow_failure) {
ESP_LOGW(TAG, "cannot clear QE bit for known permanent QE (Winbond) chips.");
} else {
ESP_LOGE(TAG, "cannot clear QE bit, please make sure force clearing QE option is enabled in `spi_flash_common_set_io_mode`, and this chip is not a permanent QE one.");
}
chip->read_mode = io_mode_before;
return;
}
@@ -458,8 +470,11 @@ static void test_toggle_qe(esp_flash_t* chip)
chip->read_mode = io_mode_before;
}
FLASH_TEST_CASE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
FLASH_TEST_CASE_3("Test esp_flash_write can toggle QE bit", test_toggle_qe);
// These tests show whether the QE is permanent or not for the chip tested.
// To test the behaviour of a new SPI flash chip, enable force_check flag in generic driver
// `spi_flash_common_set_io_mode` and then run this test.
FLASH_TEST_CASE_IGNORE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
FLASH_TEST_CASE_3_IGNORE("Test esp_flash_write can toggle QE bit", test_toggle_qe);
void test_permutations(flashtest_config_t* config)