This commit moves the dedicated GPIO LL and HAL functions from
cpu_ll.h to dedic_gpio_cpu_ll.h.
- cpu_ll_enable_cycle_count() has also been removed due to lack of feasible usage scenarios
sdmmc, sdspi: fixes related to status checks, R1b response support, erase fix for SPI mode, fix for erase timeout calculation
Closes IDF-4728
See merge request espressif/esp-idf!17727
Previous version of the code used a fixed constant (500 ms) for the
erase timeout and added 1 ms for each sector erased.
This commit improves timeouts calculation:
- For SD cards, check if erase timeout information is present in the
SSR register. If yes, use it for erase timeout calculation.
Otherwise assume 250ms per erase block, same as Linux does.
- For eMMC assume 250ms per erase block (but no less than 1 second).
This has to be improved later to use the erase timeout info in the
extended CSD register.
The legacy driver can't handle the breaking change between esp chips
very well.
And it's not elegant to extend new feature like DMA, ETM.
The new driver can return a opaque handle for each RMT channel.
An obvious transaction concept was also introduced.
TX and RX functionalities are splited out.
The legacy driver is still available, but new feature won't be added.
Enable RMT_SUPPRESS_DEPRECATE_WARN if you don't want to see the
deprecated warnings.
usb_serial_jtag: make CONFIG_DEFAULT initializer match order of structure definition (GitHub PR)
Closes IDFGH-7218
See merge request espressif/esp-idf!17886
Eliminate UT_T1_GPIO runner requirement by routing internally through gpio matrix and by setting gpio pins to GPIO_MODE_INPUT_OUTPUT mode for all interrupt related test cases.
temperature_sensor: Refactor temperature sensor to new APIs (follow rule of driverNG) and support esp32s3
Closes IDF-3665, IDF-3367, and IDF-1793
See merge request espressif/esp-idf!16787
options.
Erase command (38) for SD cards allows option for erase/dicard/fule
operation at block level and for MMC cards supports option for
discard/trim at block level. When Sanitize is executed only the
portion of data that was unmapped by a Discard command shall be
removed by the Sanitize command.
Unit test cases added to verify ERASE feature in SD/SDSPI mode.
TRIM/DISCARD/SANITIZE tests for eMMC devices.
Closes https://github.com/espressif/esp-idf/pull/7635
Closes https://github.com/espressif/esp-idf/issues/7623
