- DWC-OTG internal DMA can access psram on esp32p4
- Move DMA memory buffs to psram, to save internal ram
- HCD tests and MSC example runs in CI with psram enabled
Introduce a new HAL API `usb_dwc_hal_set_fifo_config()` that allows advanced users
to manually configure RX, Non-Periodic TX, and Periodic TX FIFO sizes. This offers
fine-grained control beyond the previous bias-based sizing approach.
The HAL function no longer returns `esp_err_t`, and internal validations are enforced
via `HAL_ASSERT()`. Responsibility for input validation has been moved to the HCD layer.
FIFO configuration must be applied before any USB pipes are created or activated.
This feature is intended for use during `usb_host_install()`.
If no custom FIFO configuration is provided (i.e., all values are zero),
the driver falls back to a bias-based default layout based on Kconfig settings
(`CONFIG_USB_HOST_HW_BUFFER_BIAS_*`). Bias resolution is done inside `hcd_port_init()`.
The `port_obj_t` structure has been extended with a `fifo_config` field, which stores
the configuration to allow re-application after a USB port reset.
Obsolete FIFO bias enums (`usb_hal_fifo_bias_t`, `hcd_port_fifo_bias_t`) and related
APIs (`hcd_port_set_fifo_bias()`) have been removed in favor of the new structure-based mechanism.
The HCD initialization and port reset flow has been updated to use the explicit
FIFO configuration.
USB Host maintainer documentation (`maintainers.md`) has been updated accordingly.
Test cases were updated to remove the usage of removed bias API and now rely on default
or custom FIFO configuration.
Previously, we included symbols from soc/usb_dwc_cfg.h and configured
the HAL and LL according to it. Now we get the configuration in runtime
from USB-DWC registers.
Added missing definition for USB FS peripheral on ESP32-P4.
Currently, USB Host unit tests that require a software triggered disconnection/
reconnection rely on the 'usb_phy_action()' function.
This commit replaces those calls with 'hcd_port_command()' or
'usb_host_lib_set_root_port_power()'.
Note: Also removed 'test_usb_common.h/c' as it is no longer necessary are the
function call replacements.
Previously, descriptors of the test devices were stored direclty in the mock
device files (e.g., "mock_[hid|msc].[h|c]"). This commit splits out the device
descriptors to separate files (e.g., "dev_[hid|msc].c") along with getter
functions.
Users that want to run the tests locally on a different device simply need to
update the "dev_[hid|msc].c" file for their device.
- added new test for usb_host_lib example for all targets
- CI USB host test are run on esp32p4
- CI USB device tests temporarily disabled until usb_device runner is fixed
- hcd and usb_host tests which do not require PHY are run on esp32p4
Some component test apps do not use the "set(COMPONENTS main)" command in their
project level "CMakeLists.txt", thus leading to their builds pulling in all
ESP-IDF components.
This commit trims the build of multiple component test apps:
- Add "set(COMPONENTS main ...)" to project level "CMakeLists.txt"
- Add missing "PRIV_REQUIRES" in some "main" component "CMakeLists.txt"
Also removed repeated configuraiton options in legacy_i2c_driver/sdkconfig.ci.defaults
as they are already specified in legacy_i2c_driver/sdkconfig.defaults
