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060f3a3b13241e4c9e160fc61a9995b51c3ba0dc
esp-idf/components/driver/test
History
Wan Lei c5b094a96f Merge branch 'test/fix_sio_mode_multi_test_faile' into 'master'
spi_master: in unit test modify communication bringup flow to fix spi sio mode test failure

See merge request espressif/esp-idf!19712
2022-08-25 16:33:10 +08:00
..
dac_dma_test
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include/test
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param_test
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CMakeLists.txt
touch_sensor: move unit tests to test_app
2022-08-08 19:12:56 +08:00
test_common_spi.c
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test_dac.c
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test_i2c.c
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test_ledc.c
ledc: Fix the usage of ledc_ls_timer_update and ledc_timer_rst
2022-08-19 19:07:46 +08:00
test_rs485.c
driver: uart rs485 fix test sync issues and fail threshold
2022-08-16 13:10:13 +08:00
test_rtcio.c
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test_sdio.c
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test_sdmmc_sdspi_init.cpp
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test_spi_bus_lock.c
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test_spi_master.c
hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces
2022-07-22 00:06:06 +08:00
test_spi_param.c
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test_spi_sio.c
spi_master: change sio test communication bringup flow to fix testcase failure
2022-08-24 14:20:26 +08:00
test_spi_slave_hd.c
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test_spi_slave.c
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test_uart.c
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