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0b9f01ac201bb4bca413d5f207aaf0222802072b
esp-idf/components/idf_test/include
History
wanlei ee02b71f1c feat(esp32c61): introduce target esp32c61
2024-03-01 21:12:25 +08:00
..
esp32
feat(sdio): sdio cross chip test app
2023-11-13 11:21:47 +08:00
esp32c2
refactor(spi_master): replace dma_ll in spi hal layer (part 2.1)
2023-12-28 19:58:54 +08:00
esp32c3
spi: add high freq test on different spi config
2023-02-27 11:27:57 +08:00
esp32c5
feat(uart): add HP/LP uart support on ESP32C5
2024-02-29 14:12:51 +08:00
esp32c6
feat(sdio): sdio cross chip test app
2023-11-13 11:21:47 +08:00
esp32c61
feat(esp32c61): introduce target esp32c61
2024-03-01 21:12:25 +08:00
esp32h2
feat(esp_timer): Re-enable tests on ESP32P4
2024-01-30 13:39:23 +02:00
esp32p4
fix(riscv): Added RISC-V functions to set interrupt threshold for CLIC targets
2024-02-28 08:51:37 +01:00
esp32s2
spi: add high freq test on different spi config
2023-02-27 11:27:57 +08:00
esp32s3
spi: add high freq test on different spi config
2023-02-27 11:27:57 +08:00
idf_performance.h
feat(sdio): sdio cross chip test app
2023-11-13 11:21:47 +08:00
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