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1597f7a035fe213a3067eda4312cc4f7e896b962
esp-idf/components/esp32/test
History
Ivan Grokhotkov 609d852834 deep sleep: power down RTC peripherals in EXT1 sleep
2016-12-16 14:30:27 +08:00
..
component.mk
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
logo.jpg
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_ahb_arb_asm.S
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_ahb_arb.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_deep_sleep.c
deep sleep: power down RTC peripherals in EXT1 sleep
2016-12-16 14:30:27 +08:00
test_fastbus_asm.S
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_fastbus.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_fp.c
remove fp unit test Kconfig
2016-11-23 16:22:34 +08:00
test_intr_alloc.c
Mark some interrupts that are now allocated dynamically as free, add int handle param documentation, add local ints test
2016-12-08 12:39:33 +08:00
test_malloc_caps.c
Add testcase, fix executable memory allocated in shared dram/iram region
2016-12-15 15:03:22 +08:00
test_miniz.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_tjpgd.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_unal_dma.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
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