mirror of
https://github.com/espressif/esp-idf.git
synced 2025-08-08 04:02:27 +00:00

Two changes to make the tests less susceptible to random failures: - Free up newlib memory to not have false-positive memory leaks due to lazy allocations in reent structure - Reset between tests, so that one failing test doesn't cause subsequent tests to fail Both changes are already applied to esp_driver_sdmmc test app.