laokaiyao 3908f4c84d i2s_test: fix output half sample rate failure

2023-01-17 11:37:22 +08:00

..

include/hal

i2s_test: fix output half sample rate failure

2023-01-17 11:37:22 +08:00

efuse_hal.c

esp32s3: fixed bug chip v0.0 detected as vX.Y

2022-12-01 01:05:09 +08:00

rtc_cntl_hal.c

light sleep: add i/d-cache tagmem retention support for esp32s3

2021-08-27 11:11:09 +08:00

touch_sensor_hal.c

touch_sensor: apply general check

2021-10-08 11:32:12 +08:00