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017ae532c0
This is a follow up commit on top of below commit:
c061c781a3
This commit further increases the ADC_TEST_LOW_VAL threshold from 2165
to 2200, because some tests were found to be failing with ADC reading
values such as 2171, 2172, 2182 etc. Suspecting the ADC callibration or
surrounding temperature to cause such fluctuations which need higher
threshold to avoid test failures.