Wan Lei c5b094a96f Merge branch 'test/fix_sio_mode_multi_test_faile' into 'master' ...

spi_master: in unit test modify communication bringup flow to fix spi sio mode test failure

See merge request espressif/esp-idf!19712

2022-08-25 16:33:10 +08:00

..

dac_dma_test

esp_adc: new esp_adc component and adc drivers

2022-07-15 18:31:00 +08:00

include/test

esp_adc: new esp_adc component and adc drivers

2022-07-15 18:31:00 +08:00

param_test

…

CMakeLists.txt

touch_sensor: move unit tests to test_app

2022-08-08 19:12:56 +08:00

test_common_spi.c

spi: support spi on h2

2022-03-29 11:54:08 +08:00

test_dac.c

esp_adc: new esp_adc component and adc drivers

2022-07-15 18:31:00 +08:00

test_i2c.c

i2c: support i2c on esp32h2

2022-04-23 07:38:25 +00:00

test_ledc.c

ledc: Fix the usage of ledc_ls_timer_update and ledc_timer_rst

2022-08-19 19:07:46 +08:00

test_rs485.c

driver: uart rs485 fix test sync issues and fail threshold

2022-08-16 13:10:13 +08:00

test_rtcio.c

freertos: Remove legacy data types

2022-02-09 23:05:45 +08:00

test_sdio.c

global: add dependency on esp_timer component and include esp_timer.h

2022-04-25 18:39:23 +02:00

test_sdmmc_sdspi_init.cpp

remove: sdspi_host deprecated api

2022-06-12 20:07:27 +00:00

test_spi_bus_lock.c

ci: partially enable ut tests for esp32c2

2022-06-02 14:23:35 +08:00

test_spi_master.c

hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces

2022-07-22 00:06:06 +08:00

test_spi_param.c

test_spi: fixed redundant quotes in test descriptions

2022-07-20 15:36:10 +08:00

test_spi_sio.c

spi_master: change sio test communication bringup flow to fix testcase failure

2022-08-24 14:20:26 +08:00

test_spi_slave_hd.c

ci: partially enable ut tests for esp32c2

2022-06-02 14:23:35 +08:00

test_spi_slave.c

ci: partially enable ut tests for esp32c2

2022-06-02 14:23:35 +08:00

test_uart.c

uart: Add a new API to get the free space size of tx buffer

2022-07-05 18:39:22 +08:00