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53e355b355888e1bf33634d42daff821e23fee13
esp-idf/components/driver/test
History
Michael (XIAO Xufeng) 9037b8fb52 mcpwm: decrease test time
cherry-pick 538540ce
2020-02-15 23:10:33 +08:00
..
include/test
…
param_test
…
CMakeLists.txt
components: use new component registration api
2019-06-21 19:53:29 +08:00
component.mk
…
test_adc2.c
…
test_common_spi.c
…
test_gpio.c
bugfix(GPIO): Fixed the bug that GPIO enables interrupts on one core,
2019-07-29 11:09:07 +00:00
test_i2c.c
Merge branch 'bugfix/ticks_to_wait_for_uart_and_i2c' into 'master'
2019-06-11 08:41:44 +08:00
test_i2s.c
i2s: test case for variation in apll clock rate
2019-06-20 16:40:58 +00:00
test_ledc.c
driver: Remove features deprecated pre-IDF V4.0
2019-09-19 18:47:15 +10:00
test_pcnt.c
driver(ledc): fixed ledc clock selection bug for release/v4.0
2019-08-12 17:16:52 +08:00
test_pwm.c
mcpwm: decrease test time
2020-02-15 23:10:33 +08:00
test_rmt.c
…
test_sdmmc_sdspi_init.cpp
…
test_sigmadelta.c
…
test_spi_master.c
spi: move deprecated functions into internal header
2019-12-24 17:43:32 +08:00
test_spi_param.c
…
test_spi_sio.c
…
test_spi_slave.c
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test_timer.c
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test_uart.c
driver: Add uart and i2c UTs to check ticks_to_wait in some functions
2019-06-05 10:38:23 +08:00
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