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5b6b624e1f53a63dc2c17093cc33d76411a2a304
esp-idf/components/driver/test/esp32
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Ivan Grokhotkov 5b6b624e1f driver: fix gpio pin_bit_mask truncation in sdspi_host and others
Closes https://github.com/espressif/esp-idf/issues/4348
2019-11-18 13:42:22 +01:00
..
test_adc2.c
examples: modify other examples and tests to use esp_netif instead of tcpip_adapter
2019-11-13 12:36:25 +01:00
test_gpio.c
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_i2c.c
ci: disable UTs for esp32s2beta without runners
2019-09-04 10:53:25 +10:00
test_i2s.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
test_ledc.c
Merge branch 'master' into feature/esp32s2beta_merge
2019-09-20 10:28:37 +10:00
test_pcnt.c
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_pwm.c
driver: fix gpio pin_bit_mask truncation in sdspi_host and others
2019-11-18 13:42:22 +01:00
test_rmt.c
ci: disable UTs for esp32s2beta without runners
2019-09-04 10:53:25 +10:00
test_rs485.c
ci: disable UTs for esp32s2beta without runners
2019-09-04 10:53:25 +10:00
test_spi_master.c
Merge branch 'master' into feature/esp32s2beta_merge
2019-10-15 14:59:27 +11:00
test_spi_param.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
test_spi_sio.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
test_spi_slave.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
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