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8b05cf41adee62048685eb4ffde1d9a81bb6b836
esp-idf/components/driver/test
History
Mahavir Jain 8b05cf41ad i2s: enable tests for esp32s2beta
2019-12-16 11:53:33 +05:30
..
esp32
i2s: enable tests for esp32s2beta
2019-12-16 11:53:33 +05:30
include/test
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
param_test
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
CMakeLists.txt
sdio: add unit test between host and slave
2019-12-03 22:58:42 +08:00
component.mk
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_common_spi.c
global: move the soc component out of the common list
2019-04-16 13:21:15 +08:00
test_i2c.c
bugfix(i2c): fix I2C driver breaking change issue.
2019-12-04 15:51:36 +08:00
test_i2s.c
i2s: enable tests for esp32s2beta
2019-12-16 11:53:33 +05:30
test_ledc.c
bugfix(LEDC):fix ledc CI issue for esp32s2beta.
2019-11-14 12:20:29 +08:00
test_rtcio.c
rtcio: add hal for driver
2019-11-21 10:40:49 +08:00
test_sdmmc_sdspi_init.cpp
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_timer.c
driver/timer: fix software reset UT (again)
2019-11-24 21:10:50 +01:00
test_uart.c
bugfix(UART): fix uart driver spinlock misused bug
2019-12-03 16:06:31 +08:00
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