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a3530f5098f7c5712cbbbc778e31d274e6c96924
esp-idf/components/driver/test_apps
History
Chen Jichang 3905701d5a fix(rmt): fix the received symbols issue
2025-03-20 11:41:19 +08:00
..
analog_comparator
…
components
fix(driver_spi): fixed slave no dma rx overwrite when trans_len below or over
2025-01-09 11:53:53 +08:00
dac_test_apps
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gpio
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gpio_extensions
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gptimer
test(gptimer): align test delta with master branch
2025-03-12 18:19:01 +08:00
i2c_test_apps
feat(i2c_master): Add an api for retrieveing handle via port
2024-10-25 16:26:05 +08:00
i2s_test_apps
fix(i2s): return error when mclk_div is smaller than 2
2024-12-24 14:46:47 +08:00
ledc
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legacy_adc_driver
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legacy_i2c_driver
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legacy_mcpwm_driver
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legacy_pcnt_driver
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legacy_rmt_driver
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legacy_rtc_temp_driver
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legacy_timer_driver
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mcpwm
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parlio
…
pulse_cnt
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rmt
fix(rmt): fix the received symbols issue
2025-03-20 11:41:19 +08:00
rs485
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sdio
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spi
fix(spi_master): fix spi halt when remove device who using rc_fast
2025-02-18 11:29:04 +08:00
temperature_sensor
refactor: changed logic of unity_tester, replaced threads by generators
2024-12-03 09:43:15 +01:00
touch_sensor_v1
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touch_sensor_v2
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twai
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uart
refactor(uart): increase test app memory leak tolerance
2025-03-07 21:46:16 +08:00
usb_serial_jtag
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.build-test-rules.yml
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