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alex
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esp-idf
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a3530f5098f7c5712cbbbc778e31d274e6c96924
esp-idf
/
components
/
driver
/
test_apps
History
Chen Jichang
3905701d5a
fix(rmt): fix the received symbols issue
2025-03-20 11:41:19 +08:00
..
analog_comparator
…
components
fix(driver_spi): fixed slave no dma rx overwrite when trans_len below or over
2025-01-09 11:53:53 +08:00
dac_test_apps
…
gpio
…
gpio_extensions
…
gptimer
test(gptimer): align test delta with master branch
2025-03-12 18:19:01 +08:00
i2c_test_apps
feat(i2c_master): Add an api for retrieveing handle via port
2024-10-25 16:26:05 +08:00
i2s_test_apps
fix(i2s): return error when mclk_div is smaller than 2
2024-12-24 14:46:47 +08:00
ledc
…
legacy_adc_driver
…
legacy_i2c_driver
…
legacy_mcpwm_driver
…
legacy_pcnt_driver
…
legacy_rmt_driver
…
legacy_rtc_temp_driver
…
legacy_timer_driver
…
mcpwm
…
parlio
…
pulse_cnt
…
rmt
fix(rmt): fix the received symbols issue
2025-03-20 11:41:19 +08:00
rs485
…
sdio
…
spi
fix(spi_master): fix spi halt when remove device who using rc_fast
2025-02-18 11:29:04 +08:00
temperature_sensor
refactor: changed logic of unity_tester, replaced threads by generators
2024-12-03 09:43:15 +01:00
touch_sensor_v1
…
touch_sensor_v2
…
twai
…
uart
refactor(uart): increase test app memory leak tolerance
2025-03-07 21:46:16 +08:00
usb_serial_jtag
…
.build-test-rules.yml
…