wanlei b1c2482592 fix(i2c): test app change gpio

2024-01-11 21:44:30 +08:00

..

components

feat(sdio): sdio cross chip test app

2023-11-13 11:21:47 +08:00

dac_test_apps/legacy_dac_driver

refactor(dac): make dac driver as component

2023-11-23 12:04:06 +08:00

i2s_test_apps

refactor(i2s): make i2s driver as component

2023-11-17 21:29:17 +08:00

legacy_adc_driver

fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12

2023-11-06 18:55:49 +08:00

legacy_i2c_driver

fix(i2c): test app change gpio

2024-01-11 21:44:30 +08:00

legacy_mcpwm_driver

ci(p4): temporarily disable failed ci tests on p4

2024-01-04 09:36:06 +08:00

legacy_pcnt_driver

change(pcnt): reenable the target test for esp32p4

2024-01-10 23:03:40 +08:00

legacy_rmt_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_rtc_temp_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_sigma_delta_driver

ci(p4): enable esp32p4 target test

2024-01-04 09:34:55 +08:00

legacy_timer_driver

ci(p4): added todo jira for disabled tests on p4

2024-01-04 09:36:38 +08:00

touch_sensor_v1

…

touch_sensor_v2

feat(touch): support touch driver on p4 (soc)

2023-11-16 11:13:02 +00:00

twai

fix(twai): enable twai interactive test for all targets on new std runner

2024-01-05 15:22:09 +08:00

.build-test-rules.yml

Merge branch 'test/enable_pcnt_ci_tests' into 'master'

2024-01-11 18:13:21 +08:00