armando b3e085cc91 test(system): increased 200B memory leak thresh due to mmu mmap mutex ...

200B to extend the thresh, real increase to the memory usage will be smaller

2025-04-15 14:26:19 +08:00

..

analog_comparator

…

components

fix(driver_spi): fixed slave no dma rx overwrite when trans_len below or over

2025-01-09 11:53:53 +08:00

dac_test_apps

…

gpio

…

gpio_extensions

…

gptimer

test(gptimer): align test delta with master branch

2025-03-12 18:19:01 +08:00

i2c_test_apps

feat(i2c_master): Add an api for retrieveing handle via port

2024-10-25 16:26:05 +08:00

i2s_test_apps

fix(i2s): return error when mclk_div is smaller than 2

2024-12-24 14:46:47 +08:00

ledc

…

legacy_adc_driver

…

legacy_i2c_driver

fix(i2c): test app change gpio

2024-01-16 11:10:36 +08:00

legacy_mcpwm_driver

…

legacy_pcnt_driver

…

legacy_rmt_driver

…

legacy_rtc_temp_driver

…

legacy_timer_driver

…

mcpwm

fix(mcpwm): fault trigger test forget connect timer and operator

2023-11-17 16:34:40 +08:00

parlio

…

pulse_cnt

…

rmt

fix(rmt): fix the received symbols issue

2025-03-20 11:41:19 +08:00

rs485

…

sdio

…

spi

test(system): increased 200B memory leak thresh due to mmu mmap mutex

2025-04-15 14:26:19 +08:00

temperature_sensor

refactor: changed logic of unity_tester, replaced threads by generators

2024-12-03 09:43:15 +01:00

touch_sensor_v1

…

touch_sensor_v2

…

twai

…

uart

refactor(uart): increase test app memory leak tolerance

2025-03-07 21:46:16 +08:00

usb_serial_jtag

…

.build-test-rules.yml

…