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c0977bf730f6bb703c45c32b01351a0f05286c31
esp-idf/components/mbedtls/test_apps/main
History
Mahavir Jain 224a308fd5 ci(test): add SHA DMA mode test for large data in PSRAM
Covers a test scenario described in following issue:
https://github.com/espressif/esp-idf/issues/11915
2023-07-28 14:23:02 +05:30
..
crts
…
app_main.c
…
CMakeLists.txt
core-system: trim build components for core-system test apps
2023-06-13 09:14:42 +08:00
idf_component.yml
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test_aes_gcm.c
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test_aes_perf.c
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test_aes_sha_parallel.c
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test_aes_sha_rsa.c
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test_aes.c
aes: fix DMA descriptor calculation for the alignment case
2023-05-31 14:19:58 +05:30
test_apb_dport_access.c
uart: Support LP_UART port with UART driver on esp32c6
2023-06-16 07:31:40 +00:00
test_apb_dport_access.h
…
test_ecp.c
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test_esp_crt_bundle.c
all: Removes unnecessary newline character in logs
2023-06-09 03:31:21 +08:00
test_mbedtls_ecdsa.c
…
test_mbedtls_mpi.c
fix(mbedtls): Fix incorrect assert for H/W MPI operations
2023-07-13 14:52:00 +05:30
test_mbedtls_sha.c
ci(test): add SHA DMA mode test for large data in PSRAM
2023-07-28 14:23:02 +05:30
test_mbedtls_utils.c
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test_mbedtls_utils.h
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test_mbedtls.c
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test_rsa.c
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test_sha_perf.c
feat(esp_gdma): add hal interface for common operations
2023-07-10 13:45:57 +08:00
test_sha.c
ci(mbedtls): added a test for the mbedtls_internal_shaX_process API
2023-07-14 04:08:30 +00:00
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