laokaiyao d444b5831b fix(i2s): fix multi-dev test failure

2024-10-22 14:52:37 +08:00

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analog_comparator

feat(ana_cmpr): supported etm in analog comparator example

2023-09-25 19:57:34 +08:00

components

feat(spi_master): p4 enable test and examples

2023-10-08 14:45:52 +08:00

dac_test_apps

fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12

2023-11-07 14:11:10 +08:00

gpio

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gpio_extensions

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gptimer

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i2c_test_apps

fix(i2c_master): Fix the issue that probe cannot work properly after a general call,

2024-07-04 12:29:05 +08:00

i2s_test_apps

fix(i2s): fix multi-dev test failure

2024-10-22 14:52:37 +08:00

ledc

feat(ledc): support ledc on esp32p4

2023-10-17 16:40:04 +08:00

legacy_adc_driver

Merge branch 'feature/support_adc_calibration_on_h2_v5.2' into 'release/v5.2'

2023-11-09 12:14:40 +08:00

legacy_i2c_driver

fix(i2c): test app change gpio

2024-01-16 11:10:36 +08:00

legacy_mcpwm_driver

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legacy_pcnt_driver

feat(ledc): support ledc on esp32p4

2023-10-17 16:40:04 +08:00

legacy_rmt_driver

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legacy_rtc_temp_driver

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legacy_timer_driver

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mcpwm

fix(mcpwm): fault trigger test forget connect timer and operator

2023-11-17 16:34:40 +08:00

parlio

feat(parlio_tx): supported parlio tx on p4

2023-09-25 10:42:30 +08:00

pulse_cnt

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rmt

fix(rmt): fix the counting clock used by rx filter on esp32/s2

2024-04-08 11:16:18 +08:00

rs485

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sdio

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spi

feat(spi_master): p4 enable test and examples

2023-10-08 14:45:52 +08:00

temperature_sensor

fix(temperature_sensor): Fix the value is incorrect if disable and enable again

2024-02-21 11:58:22 +08:00

touch_sensor_v1

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touch_sensor_v2

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twai

feat(twai): support multiple twai controllers

2023-10-12 09:59:27 +08:00

uart

feat(uart): support uart module sleep retention on c6/h2

2024-06-18 15:04:20 +08:00

usb_serial_jtag

feat(usb_serial_jtag): Add pytest for usb_serial_jtag

2023-10-10 10:05:46 +08:00

.build-test-rules.yml

Merge branch 'bugfix/compile_usj_fail_c6' into 'master'

2023-10-10 13:47:19 +08:00