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debf2c0b7014f3405b0974f36aa61bb09677b1df
esp-idf/components/driver/test_apps
History
Wang Yuan Ze debf2c0b70 Merge branch 'test/move_touch_related_unit_tests_to_test_apps' into 'master'
test: move touch related unit tests to test apps

Closes IDFCI-1283, IDFCI-1156, and IDF-5766

See merge request espressif/esp-idf!19348
2022-08-09 23:15:18 +08:00
..
gpio
gpio: add test with -O0
2022-08-02 23:07:06 +08:00
gptimer
kconfig: refactor xtal freq kconfig to common configuration item
2022-08-05 19:12:29 +08:00
i2s_test_apps
i2s: fixed duplicated test case name
2022-08-08 20:35:47 +08:00
legacy_adc_driver
ci: raise legacy adc high/low test low thresh
2022-08-03 11:28:52 +08:00
legacy_mcpwm_driver
mcpwm: deprecate legacy driver
2022-07-27 15:08:58 +08:00
legacy_pcnt_driver
…
legacy_rmt_driver
build system: re-add -Wno-format as private flag for some components
2022-08-03 16:42:47 +04:00
legacy_rtc_temp_driver
…
legacy_timer_driver
esp_hw_support: Remove compare_set.h API
2022-07-22 00:06:06 +08:00
mcpwm
build system: re-add -Wno-format as private flag for some components
2022-08-03 16:42:47 +04:00
pulse_cnt
pcnt: add test with -O0
2022-08-02 23:07:06 +08:00
rmt
rmt: add test with -O0
2022-08-02 23:07:06 +08:00
sdm
gpio: add test with -O0
2022-08-02 23:07:06 +08:00
temperature_sensor
…
touch_sensor_v1
touch_sensor: move unit tests to test_app
2022-08-08 19:12:56 +08:00
touch_sensor_v2
touch_sensor: move unit tests to test_app
2022-08-08 19:12:56 +08:00
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