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e323d22353b57dfbf8f1af1682bcf9c3206b31a7
esp-idf/components/driver/test_apps
History
gaoxu d74f12dea7 feat(adc): support ADC calibration on ESP32P4
2025-04-01 15:07:56 +08:00
..
components
fix(driver_spi): enable p4 multi dut test
2024-10-15 12:06:47 +08:00
dac_test_apps/legacy_dac_driver
…
i2s_test_apps
feat(i2s): support i2s on esp32c61
2024-10-22 15:12:38 +08:00
legacy_adc_driver
feat(adc): support ADC calibration on ESP32P4
2025-04-01 15:07:56 +08:00
legacy_i2c_driver
test(i2c): Enable all i2c test on esp32p4, esp32c5
2024-08-26 10:43:22 +08:00
legacy_mcpwm_driver
…
legacy_pcnt_driver
…
legacy_rmt_driver
…
legacy_rtc_temp_driver
…
legacy_sigma_delta_driver
…
legacy_timer_driver
…
touch_sensor_v1
…
touch_sensor_v2
…
twai
test(twai): test with sleep retention
2024-10-18 14:14:16 +08:00
.build-test-rules.yml
feat(adc): support ADC calibration on ESP32P4
2025-04-01 15:07:56 +08:00
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