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ea2afa83a89baaa8cc1dfb51d14567363c42b5c1
esp-idf/components/spi_flash/test
History
Angus Gratton 670733df9f spi_flash: Abort on writes to dangerous regions (bootloader, partition table, app)
Can be disabled or made into a failure result in kconfig if needed.
2017-11-03 15:52:27 -07:00
..
component.mk
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_cache_disabled.c
add test case for invalid cache access interrupt
2017-04-13 15:27:39 +08:00
test_flash_encryption.c
unit tests: Use a unit test app partition table, configure spi_flash to use data partition
2017-02-22 10:26:04 +11:00
test_large_flash_writes.c
spi_flash: Fix SPI flash write alignment/size bugs
2017-06-09 17:33:27 +10:00
test_mmap.c
This commit adds spi_flash_mmap_pages(), a function to map a set of unordered 64K pages in flash into a contiguous region in memory space.
2017-06-23 14:28:57 +08:00
test_out_of_bounds_write.c
spi_flash: Abort on writes to dangerous regions (bootloader, partition table, app)
2017-11-03 15:52:27 -07:00
test_partitions.c
spi_flash: Fixed bug in SPI flash ROM driver to work with embedded flash chip
2017-04-11 10:51:19 +08:00
test_read_write.c
spi_flash: fix spi_flash_read into buffer in external RAM, add test
2017-10-19 21:35:21 +08:00
test_spi_flash.c
unit test: adapt tests to single core configuration
2017-10-19 21:35:21 +08:00
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