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f7b51c164d0b99c99a22d10d191b2ed43cca200c
esp-idf/components/driver/test/esp32
History
Angus Gratton 50aad77f3a driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
..
test_adc2.c
examples: modify other examples and tests to use esp_netif instead of tcpip_adapter
2019-11-13 12:36:25 +01:00
test_gpio.c
bugfix(gpio):fix esp32 s2 rtc io issue
2019-11-27 17:18:20 +08:00
test_i2c.c
bugfic(i2c): fix i2c driver ut issue.
2019-11-25 07:03:02 +00:00
test_i2s.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
test_pcnt.c
fix unit test and examples for s2beta
2019-09-04 10:53:25 +10:00
test_pwm.c
mcpwm: add HAL layer support
2019-11-25 00:36:30 +08:00
test_rmt.c
rmt: add HAL layer
2019-11-20 10:54:21 +08:00
test_rs485.c
ci: disable UTs for esp32s2beta without runners
2019-09-04 10:53:25 +10:00
test_sdio.c
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
test_spi_master.c
Merge branch 'master' into feature/esp32s2beta_merge
2019-10-15 14:59:27 +11:00
test_spi_param.c
driver: Rename "local" tests to "single board" tests, add some description to the names
2019-12-12 11:05:04 +11:00
test_spi_sio.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
test_spi_slave.c
ci: disable unavailable tests for esp32s2beta
2019-09-04 10:53:25 +10:00
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