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fix(driver_spi): fix some master test apps

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This commit is contained in:
wanckl
2025-12-15 16:58:10 +08:00
parent 613e2aefce
commit 6be402c177
2 changed files with 2 additions and 4 deletions
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2
components/esp_driver_spi/test_apps/master/main/test_spi_master.c
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@@ -124,7 +124,7 @@ TEST_CASE("SPI Master clockdiv calculation routines", "[spi]")
// Test All clock source
#define TEST_CLK_BYTE_LEN 10000
#define TEST_TRANS_TIME_BIAS_RATIO (float)5.0/100 // think 5% transfer time bias as acceptable
#define TEST_TRANS_TIME_BIAS_RATIO (float)8.0/100 // think 8% transfer time bias as acceptable
TEST_CASE("SPI Master clk_source and divider accuracy", "[spi]")
{
int64_t start = 0, end = 0;

4
components/esp_driver_spi/test_apps/master/main/test_spi_sio.c
View File

@@ -140,7 +140,6 @@ TEST_CASE("SPI Single Board Test SIO", "[spi]")
}
#endif //#if (TEST_SPI_PERIPH_NUM >= 2)
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32P4) //IDF-7503 slave support
/********************************************************************************
* Test SIO Master
* SIO Slave is not supported, and one unit test is limited to one feature, so,,,
@@ -271,7 +270,7 @@ void test_sio_slave_emulate(bool sio_master_in)
unity_wait_for_signal("Master ready");
for (int i = 0; i < TEST_NUM; i++) {
spi_slave_transaction_t trans = {};
spi_slave_transaction_t trans = { .flags = SPI_SLAVE_TRANS_DMA_BUFFER_ALIGN_AUTO, };
if (sio_master_in) {
// slave output only section
trans.length = (i + 1) * 8 * 8;
@@ -324,4 +323,3 @@ void test_slave_run(void)
}
TEST_CASE_MULTIPLE_DEVICES("SPI_Master:Test_SIO_Mode_Multi_Board", "[spi_ms][test_env=generic_multi_device]", test_master_run, test_slave_run);
#endif //p4 slave support